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Found 2 from your keywords: author=Fearn, Sarah,
cover
An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) …
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Institute of Physics (Great Britain),Fearn, Sarah,Morgan & Claypool Publishers,

"Version: 20151001"--Title page verso."A Morgan & Claypool publication as part of IOP Concise Physics"--Title page verso.Includes bibliographical references.Preface -- Author biography -- 1. Introduction -- 1.1. Overview -- 1.2. Basic principles2. Practical requirements -- 2.1. Ion generation -- 2.2. Primary and sputter ion beam sources -- 2.3. Mass analysis -- 2.4. Ion detection -- 2.5. Ultra …

Edition
-
ISBN/ISSN
9781681740881
Collation
1 online resource (various pagings) :illustrations (some color).
Series Title
-
Call Number
-
cover
Secondary ion mass spectrometry and its application to materials science /
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Institute of Physics (Great Britain),Fearn, Sarah,

"Version: 20250801"--Title page verso.Revised edition of: An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science.Includes bibliographical references.1. Introduction -- 2. Secondary ion generation, analysis, and detection -- 2.1. Secondary ion generation -- 2.2. Filtering, focussing, and steering -- 2.3. Sputtering and ionisation -- …

Edition
Second edition.
ISBN/ISSN
9780750333313
Collation
1 online resource (various pagings) :illustrations (some color).
Series Title
-
Call Number
-