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Found 1 from your keywords: author=Basu, Saibal,
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Neutron and x-ray reflectometry :emerging phenomena at heterostructure interf…
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Institute of Physics (Great Britain),Basu, Saibal,Singh, Surendra

"Version: 20221201"--Title page verso.Includes bibliographical references.1. Introduction -- 1.1. Interface-driven properties using neutron/x-ray reflectometry -- 1.2. Emerging phenomena at interfaces using polarized neutron reflectometry -- 1.3. Thin-film growth mechanisms -- 1.4. Thin-film deposition techniques -- 1.5. Other complementary surface characterisation techniques2. Theory of neutro…

Edition
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ISBN/ISSN
9780750346955
Collation
1 online resource (various pagings) :illustrations (some color).
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