Secondary ion mass spectrometry and its application to materials science /

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"Version: 20250801"--Title page verso.Revised edition of: An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science.Includes bibliographical references.1. Introduction -- 2. Secondary ion generation, analysis, and detection -- 2.1. Secondary ion generation -- 2.2. Filtering, focussing, and steering -- 2.3. Sputtering and ionisation -- 2.4. Mass analysis -- 2.5. Secondary ion detection -- 2.6. Ultrahigh vacuum3. Experimental ion beam considerations -- 3.1. Ion beam selection -- 3.2. Ion beam interactions -- 3.3. Modes of SIMS analysis4. Data handling -- 4.1. Quantification based on relative sensitivity factors and ion implant standards -- 4.2. Quantification without standards -- 4.3. Multivariate analytical techniques -- 4.4. Sample handling and preparation5. Applications -- 5.1. Functional devices -- 5.2. Metals and alloys -- 5.3. Energy-related materials -- 5.4. Biosciences -- 6. Outlook.Full-text restricted to subscribers or individual document purchasers.In this edition of Secondary Ion Mass Spectrometry and Its Application to Material Science the authors expand further on the principles and methods presented in the first edition. A more detailed overview of the principles of SIMS is given, and of how the development of dual-beam instruments has blurred the traditional fields of dynamic and static SIMS to enable greater analytical possibilities. In particular, the development and application of cluster ion beams, and how this has opened up a new area of materials analysis. Practical information on how to obtain high quality SIMS data, and what parameters should be used to define this are also considered.Advanced undergraduates and graduate students in materials, physics, chemistry and engineering.Also available in print.Mode of access: World Wide Web.System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.Sarah Fearn obtained her PhD from the Department of Materials, Imperial College in 2000. After working in commercial SIMS analysis for two years, she returned to academia in 2002. Since then, she has worked on a variety of research projects that have all applied SIMS as the main characterisation tool for understanding a range of material science issues such as glass corrosion, to calcium deposits in eye tissue. Over the last 20 years she has published ~90 papers spanning a wide range of material science issues and the application of SIMS. Since 2012 she has been in charge of the surface analysis laboratory in the Department of Materials at Imperial College.Title from PDF title page (viewed on September 5, 2025).

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Series Title

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Call Number

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Publisher

: .,

Collation

1 online resource (various pagings) :illustrations (some color).

Language

English

ISBN/ISSN

9780750333313

Classification

543/.65

Content Type

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Media Type

-

Carrier Type

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Edition

Second edition.

Subject(s)

SCIENCE / Spectroscopy & Spectrum Analysis.
Materials science.
Secondary ion mass spectrometry.
Time-of-flight mass spectrometry.
Spectrum analysis, spectrochemistry, mass spectrom

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Statement of Responsibility

Sarah Fearn.

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