Quantum metrology with photoelectrons.
"Version: 20180401"--Title page verso."A Morgan & Claypool publication as part of IOP Concise Physics"--Title page verso.Includes bibliographical references.part I. Concepts and fundamentals -- 1. Introduction : concepts in photoionization interferometry -- 1.1. Quantum metrology -- 1.2. Construction and deconstruction of paradigms : photoionization as interferometry -- 1.3. Something old, something new : photoelectron spectroscopy, charged-particle imaging, technology, complexity and emergence -- 1.4. Putting it all together : quantum metrology with photoelectrons2. Fundamentals of photoelectron interferograms -- 2.1. Continuum wavefunctions, observables and information content -- 2.2. Photoionization and photoelectron interferograms in detail3. Multi-photon processes -- 3.1. Molecular photoionization from prepared states -- 3.2. Light and matterpart II. Examples and numerics -- 4. Scattering wavefunctions and photoionization : Coulombic systems -- 4.1. Coulomb wavefunctions -- 4.2. Hydrogenic bound states -- 4.3. Dipole matrix elements and observables -- 4.4. Discussion5. Scattering wavefunctions and photoionization : non-Coulombic systems -- 5.1. Computational tools -- 5.2. Homonuclear and heteronuclear diatomics : N2 and CO -- 5.3. Larger molecules : DABCO and ABCO -- 5.4. MF observables -- 5.5. Summary : non-Coulombic molecular scatterers6. Wavepacket dynamics -- 6.1. Rotational wavepacket model system -- 6.2. Electronic wavepacket model -- 6.3. Vibronic dynamics in CS2 : model system -- 6.4. Vibronic dynamics in CS2 : realistic system and ab initio treatment7. Light and matter -- 7.1. Shaped laser pulses -- 7.2. XUV + IR fields : AR-RABBITT observables.Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.Also available in print.Mode of access: World Wide Web.System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.Paul Hockett earned his PhD in 2008 from the University of Nottingham, UK and joined the National Research Council of Canada in 2009. Paul's research interests cover a range of topics spanning the areas of AMO (atomic, molecular, and optical), quantum, and computational physics (and physical chemistry), with a particular focus on fundamental light-matter interactions, spectroscopy, and application to complex systems.Title from PDF title page (viewed on May 4, 2018).
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